How Sensor Performance Enables Condition-Based Monitoring Solutions
Advancements in semiconductor technologies and capabilities are enabling new opportunities to sense, measure, interpret and analyze data in industrial applications, and in particular, condition-based monitoring (CbM) solutions. Next-generation sensors based on MEMS technology combined with advanced algorithms for diagnostic and prognostic applications expand opportunities to measure a variety of machines and improve the ability to effectively monitor equipment, improving uptime, enhancing process quality, and increasing throughput.
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