A qualitatively new method applicable for process variability band (PVband) improvement and printability enhancement in resolution enhancement technique (RET) applications is reported. The method does not use costly simulations through the process window (PW). Instead, it utilizes a unique feedback mechanism derived from the intensity distribution information available during nominal optical proximity correction (OPC) simulation. Consequently, this Intensity Slope Correction (ISC) method provides superior performance as compared to traditional process window aware OPC tools.

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