Extended Temperature Support for Cyclone II and MAX II Devices
Semiconductor devices undergo at least two types of testing: device characterization and production testing. Device characterization is used to verify the performance of a semiconductor design and its physical implementation. Production testing is used to find manufacturing defects that randomly occur during the manufacture of all semiconductor devices. This technical brief describes these testing methods and the roles they play in supporting extended temperature Altera Cyclone II and MAX II devices.
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