With increasing data rate speeds, more complex testing methodology, and shrinking margins, memory designers and engineers face new challenges when debugging and validating memory designs. The complex testing methodologies included in both the DDR4 and LPDDR4 specifications require more than the standard setup and hold time measurements commonly used for testing and require you to pay more attention to high-speed signal integrity issues. This application notes describes how you can meet these challenges and make fast, accurate DDR4/ LPDDR4 measurements by using a Keysight Infiniium Mixed-Signal Oscilloscope (MSO).