In the September 2005 issue of IEEE Transactions on Device and Materials Reliability, the article entitled
“The Rosetta Experiment: Atmospheric Soft Error Rate
Testing in Differing Technology FPGAs” describes real-time experiments that evaluated large Xilinx field programmable gate arrays (FPGAs) fabricated in two CMOS technologies (150-nm and 130-nm) for their sensitivity to radiation-induced, single-event upsets and detailed the results from simulation, beam testing, and atmospheric testing.


This paper clarifies some open issues from the 2005 Xilinx Rosetta experiments and presents additional results for 90 nm and 65 nm technology nodes.