When computing time-domain impedance profile from measured S-parameters, we face two types of problems. First is caused by low quality of sampled S-parameters, such as insufficient resolution, band-limiting, noise etc. The second problem is the fact that even with the ideal data, the computed impedance profile does not show the correct characteristic impedance of each section of the connector, because multiple reflection mask the ‘true’ value of the characteristic impedance of the distant sections. This paper addresses both of these challenges.