The transition towards Embedded System Access has initiated a real paradigm shift regarding validation, test, programming, and debugging of complex electronics units. Within this context, more and more instruments are directly implemented in silicon or uploaded into FPGAs as soft macro to be able to see exactly what silicon sees. New standards drive standardized access to these instruments and facilitate their use throughout the entire product life cycle. In perspective, particularly FPGA-embedded instruments are promising an enormous applicability. However, test systems must be capable of efficiently putting these possibilities into practice. Read this paper to learn more.