Characterization of Sigfox Devices from Lab to Production Line

Authored by Joerg Koepp, et al

Application Note

The application note guides developers and manufactures of Sigfox Devices to perform the required and recommended measurements with test solutions from Rohde & Schwarz. The note will help bring ultra-narrowband IoT devices and applications using Sigfox technology to the market as fast as possible and help ensure the desired quality and performance.

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Characterization of Sigfox Devices from Lab to Production Line

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