The next generation of high-speed serial bus stadards, with data rates of 5 Gb/s and higher, will
become available in 2006. The increasing speeds create significant signal integrity and jitter issues for design and test. New transmission techniques are also making performance characterization more difficult and time-consuming. The Agilent N4903A high-performance serial Bit Error Ratio Tester (BERT) provides the only complete jitter- tolerance test solution for fast, high-quality characterization of next-generation serial devices. The jitter laboratory shows the BERT is a reliable instrument for creating and measuring jitter.