The core reference for Boundry Scan is the IEEE 1149.1 Standard: IEEE Standard 1149.1-2001 “Test Access Port and Boundary-Scan Architecture,” available from the IEEE. The standard was first published in 1990, revised in 1993 and 1994, and most recently in 2001. In this detailed tutorial, you will learn the basic elements of boundary-scan architecture—where it came from, what problem it solves, and the implications on the design of an integrated-circuit device.