The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embedded IP, the new IEEE P1687 standard 1 is being defined by a broad coalition of IP vendors, IP users and major ATE companies. This new standard, also called IJTAG, is expected to be rapidly and widely adopted by the semiconductor industry. The P1687 standard will enable the industry to develop test patterns for IPs on the IP level without having to know how the IP will be embedded within different designs.