This paper looks at a platform integration which provides designers with a fast, highly accurate, and multi-purpose parasitic extraction tool that enables post-layout simulation across a wide range of designs and advanced process nodes. Topics covered include:

  • Review of the types of parasitic effects and why they are important: resistance, capacitance and inductance
  • Advantages of the new Calibre xACT suite in solving challenges at 16nm and beyond
  • Scalable net-based parallel processing used in the table-based engine
  • Integrated field solver to calculate parasitics around three-dimension finFET structures
  • Advances including innovative geometries such as finFETS, and complex techniques like multi-patterning