Accelerated Testing and Failure Diagnosis of High-Power Semiconductors using Thermal Characterization Methods
The energy demands of both consumer and industrial electronic systems are increasing, and electronics power component suppliers as well as OEMs are faced with the challenge of providing the highly reliable systems needed for aviation, electric vehicles, trains, power generation, and reusable energy production.
In this paper, two examples using IGBT modules illustrate how this issue can be addressed by accelerating testing and diagnosis of possible failure causes of power components.
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