A Holistic Approach to Embedded Systems Development
The Software Engineering Effectiveness Model (SEEM), was well received at the 2003 ESC(W) Conference. Based on feedback received, this paper reviews the latest status of SEEM, including updates to key features and introduces the latest enhancements. These enhancements include Concept Selection and the Learning-Principle-Concept (LPC) Loop. This paper follows a case study from start to finish providing a survey of practical techniques for the application of SEEM to an embedded system product.
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