PHY layer data-generator works to 12.5-Gbits/s

Agilent Technologies announces a serial bit-error-ratio tester with advanced jitter generation capabilities for jitter-tolerance testing of serial gigabit devices. Automated and compliant jitter-tolerance testing covers all popular serial bus standards, such as PCI Express, SATA, Fibre Channel, FB-DIMM, CEI, Gigabit Ethernet and XFP.