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Characterization of Sigfox Devices from Lab to Production Line

Authored on: Feb 1, 2018 by Joerg Koepp, et al

Technical Paper / Application Note

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The application note guides developers and manufactures of Sigfox Devices to perform the required and recommended measurements with test solutions from Rohde & Schwarz. The note will help bring ultra-narrowband IoT devices and applications using Sigfox technology to the market as fast as possible and help ensure the desired quality and performance. 


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