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A Methodology for High-Speed Nanometer Transceiver Verification, Validation, and Characterization

Authored on: Jul 1, 2014 by Tim Hoang, Scott Guyton

Technical Paper

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This paper describes a new circuit validation and characterization flow that enables users to easily set up, run, record pass/fail, and analyze very complex tests. The validation and characterization flow was standardized across the design team, leveraging knowledge and computing resources and significantly improving design productivity.

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