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The Dual Clock Gbit Chip Test

Authored on: Dec 14, 2005

Technical Paper / Product Paper

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Agilent Technologies pulse generators are a necessity in the world of semiconductor test clocks and digital communication clocks.

Many customers need the ability to generate more than one clock signal simultaneously and at multiple frequencies. The 81110A is a perfect fit for functional tests of the Gbit chip in the dual clock mode. Using the pattern capability, it is easy to create the necessary clock signals, one at 150 MHz and the other at 30 MHz.

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