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The Future of Reliability Testing

Posted on: Feb 7, 2020 | Duration: 40 mins
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A unique opportunity to hear Dr. Joe McPherson, a renowned reliability expert, discuss how in-field degradation monitoring can be achieved by on-chip monitoring. You’ll learn how deep data can detect failure patterns and enable preemptive and predictive maintenance.

Attendees will learn about:

  • How on-chip circuit monitoring and off-chip data analytics point to the Physics of Failure, thus estimating the time to failure
  • How early warnings on system health and performance minimize disruption and unnecessary costs
  • How to get more visibility during lifetime acceleration tests and correlate these tests to in-field data
  • How to realistically achieve zero ppm for critical (life impacting) chip applications

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