The Future of Reliability Testing
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With electronics playing a such a critical role in our everyday life, reliability has moved center-stage. In Automotive, Datacenter, Medical and other landscapes, uptime is essential. However, the underlying ICs being implemented in advanced electronics call for mega-functionality, Nano-scale manufacturing processes, heterogeneous packaging and eventually, ceaseless use, posing new quality and reliability challenges.
What will be the next big step in ensuring that sudden system failures never occur? In this on-demand webinar, a new solution for in-field degradation monitoring will be introduced by Dr. Joe McPherson, a renowned reliability expert. Watch the video to learn how deep data can detect failure patterns and enable preemptive and predictive maintenance.
Attendees will learn about:
- How on-chip circuit monitoring and off-chip data analytics point to the Physics of Failure, thus estimating the time to failure
- How early warnings on system health and performance minimize disruption and unnecessary costs
- How to get more visibility during lifetime acceleration tests and correlate these tests to in-field data
- How to realistically achieve zero ppm for critical (life impacting) chip applications