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Calibre® PERC™: Effective Reliability and Low Power Verification

Posted on: Jan 3, 2012 | Duration: 60 minutes

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Join Mentor Graphics for this On-Demand Seminar and Product Demonstration (held live in San Jose, CA. Dec 2011) and learn how to improve design quality and mitigate otherwise difficult to find errors within your design and verification flows with Calibre® PERC™.

Protecting against ESD, Latch-up, reliability and other EOS events can be challenging, particularly when multiple power domains and thinoxide gates are used extensively. Detailed SPICE/Mixed-Mode simulation is an often used, but costly (in terms of runtime, coverage and expertise) step in understanding the protection your design will enjoy while identifying any potential reliability issues.

During this seminar, we will review how Calibre PERC offers an effective and easy to use solution that is able to look at the entire design in context and answer these reliability questions for you, without the need for full simulation.

What you will Learn

  • How to detect sources of reliability issues within your designs

  • Benefits of voltage dependant, and voltage aware checks - both on the topological representation of your design (netlist), and the physical layout

  • How to effectively verify signal paths in multi-power domain designs

Who Should View

  • IC and system design engineers, verification specialists and management

Presenter Bios

Dhaval Shah
Dhaval Shah is the Calibre PERC Lead for North Americas Technical Sales team at Mentor Graphics. He has worked as Application Engineer supporting Calibre and Analog/Mixed-signal products lines and has over 8 years of design and field experience. Dhaval holds a B.E. in electronics and communications and M.S. in electrical engineering from University of Southern California.

Matthew Hogan
Matthew Hogan is a Calibre Marketing Engineer for Mentor Graphics. With over 15 years of design and field experience, he is well-versed in the issues that are imposed on today's aggressive designs. Matthew is an IEEE Senior Member and ACM Member. He also holds a B.Eng and an MBA.

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