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Going Parallel with LabVIEW Delivers Test Throughput Gains

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September 15, 2008
 

National Instruments

Frank Lloyd Wright, an influential 20th century architect, once said, "Every great architect... must be a great original interpreter of his time, his day, his age." The same can be said for test system architects. They must interpret evolving technologies, such as multicore processors, field-programmable gate arrays (FPGAs), and high-speed data buses like PCI Express, as they design, develop, and implement the systems they have been commissioned to build. By combining these technologies with NI LabVIEW parallel programming software and NI TestStand test management software, test engineers can create high-performance test systems capable of parallel processing, parallel measurements, and even completely parallel test on the production floor. By going parallel with PC-based technologies, you can test devices up to 10 times faster than traditional instrumentation.

 
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