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		<title>TechOnLine.com - Upcoming Webcasts</title>
		<link>http://www.techonline.com</link>
		<description>Calendar of all upcoming TechOnLine Webcasts for electronics engineers</description>
		<language>en-us</language>
		<copyright>Copyright 2008 TechInsights, a Division of United Business Media LLC. All rights reserved.</copyright>
		<docs>http://blogs.law.harvard.edu/tech/rss</docs>
		<managingEditor>submissions@techonline.com</managingEditor>
		<webMaster>support@techonline.com</webMaster>
		<ttl>15</ttl>
		<item>
			<title><![CDATA[Oct 8 2008 01:00PM -- Ten Things You Should Know About MIMO]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=bae3e01805764728d827184f415eb5a3]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210102164</pheedo:origLink>
			<description><![CDATA[This webcast describes ten topics relating to MIMO radio operation and measurement. It draws from all three of the key OFDM technologies adopting MIMO, namely 802.11n, WiMAX and LTE. The webcast is intended for engineers and managers who are either new to MIMO or want to understand how the techniques of operation and measurement are applied across multiple technologies. <br style="clear: both;"/>
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			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210102164]]></guid>
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		<item>
			<title><![CDATA[Oct 9 2008 02:00PM -- Controlling BLDCs with the Lowest Software Overhead]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=d75bf3d0af20228bff3da9da6c7d82ef]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210601529</pheedo:origLink>
			<description><![CDATA[When controlling brush-less DC motors (BLDCs) there are a variety of control methods to increase efficiency, torque and speed. This webinar outlines how to use the built-in features of Infineon's 8-bit microcontrollers to eliminate external components and decrease development time. BLDC theory, Sensor-less Control and Sinusoidal/Vector Control (FOC) will be presented.<br style="clear: both;"/>
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			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210601529]]></guid>
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		<item>
			<title><![CDATA[Oct 14 2008 01:00PM -- TDR, S-Parameters &amp;#38; Differential Measurements Webcast]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=21066de4e88cada8c6d2ac8a53e6492f]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210603478</pheedo:origLink>
			<description><![CDATA[With the increase in speed of digital system design into the gigahertz region, frequency dependent effects become a more prominent challenge than in the past. The proliferation of high speed serial data formats in today's digital standards demand differential circuit topology. A paradigm shift in measurement technology is required to achieve the design goals of the advanced differential physical layer. It is now necessary to consider both time and frequency domain analysis to obtain proper characterization. This presentation reviews TDR, S-Parameters, and Differential measurements using a TDR.<br style="clear: both;"/>
    <a style='font-size: 10px; color: maroon;' href='http://www.pheedo.com/hostedMorselClick.php?hfmm=v3:f63503edbeae131df505d2941b893e7c:5xzsAhtGIR%2F%2BFRUCsn73Eibt%2F80pwzrKJnXvw%2FPSiOmJr8gPsWD6fZ4rTk905%2BZsEBiv1PAC0KB5'><img border='0' title='Email this Article' alt='Email this Article' src='http://www.pheedo.com/images/mm/emailthis.png'/></a>
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<img src="http://www.pheedo.com/feeds/tracker.php?i=21066de4e88cada8c6d2ac8a53e6492f" style="display: none;" border="0" height="1" width="1" alt=""/>]]></description>
			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210603478]]></guid>
		</item>
		<item>
			<title><![CDATA[Oct 15 2008 02:00PM -- Buying Time: Using Signal Integrity and Common Sense to Meet Timing Margins for High Speed Memory Interfaces]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=20f618bb1f7d82c5de0def1fb370e43a]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210101883</pheedo:origLink>
			<description><![CDATA[Each memory transaction requires that signaling must meet set up and hold requirements for a given frequency. In fact, there are several timing domains that must be satisfied for each transaction. Each of these interfaces are source-synchronous, requiring the strict maintenance of skew and other uncertainty effects. For each of these interfaces, the contributors can be assigned to: The transmitter; The interconnect; The receiver. This webinar will discuss the impact of these sets of contributors, with emphasis on signal integrity techniques to address margin eroders such as crosstalk, simultaneously switching outputs, impedance mismatch and inter-symbol interference.<br style="clear: both;"/>
    <a style='font-size: 10px; color: maroon;' href='http://www.pheedo.com/hostedMorselClick.php?hfmm=v3:089f9345fa5ece944f9d701cbe2331a6:i7E6g5LsZme06RYg0cssfmaLaxBlGoekvGIa8XhpgOkf15a%2BERuc%2F7A6h5jsTGR6n%2BoQwzMjmFXp'><img border='0' title='Email this Article' alt='Email this Article' src='http://www.pheedo.com/images/mm/emailthis.png'/></a>
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<br style="clear: both;"/>      <a href="http://www.pheedo.com/click.phdo?s=20f618bb1f7d82c5de0def1fb370e43a"><img alt="" style="border: 0;" border="0" src="http://www.pheedo.com/img.phdo?s=20f618bb1f7d82c5de0def1fb370e43a"/></a>
  <img src="http://www.pheedo.com/feeds/tracker.php?i=20f618bb1f7d82c5de0def1fb370e43a" style="display: none;" border="0" height="1" width="1" alt=""/>]]></description>
			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210101883]]></guid>
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		<item>
			<title><![CDATA[Oct 16 2008 01:00PM -- New Trends in Optical Transceiver Test]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=ae25f9df3e6d15188b8297a1e7ea761b]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210604028</pheedo:origLink>
			<description><![CDATA[Optical transmitter performance has historically been defined through parameters such as eye-masks, noise, and modulation power. As new communications standards are developed these will still be important parameters. Yet as data speeds increase, the performance of the optical channel can become a limiting factor in system performance. Receivers can employ equalization to compensate for channel performance. This presents an interesting problem for transceiver test. If a sophisticated receiver can compensate for a degraded signal, what defines adequate performance for the transmitter? How far can a receiver be pushed before it can no longer compensate for distorted signals? This seminar will discuss these issues as well as other new trends in optical transceiver test.
<br style="clear: both;"/>
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			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210604028]]></guid>
		</item>
		<item>
			<title><![CDATA[Oct 22 2008 01:00PM -- MIMO Channel Modeling and Emulation Test Challenges]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=1654fd021a22d12b6ddba4d9a171abf5]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210603655</pheedo:origLink>
			<description><![CDATA[Modern radio designers have always looked for ways to improve spectral efficiency to transmit more bits per Hz without sacrificing signal quality. This paper covers how antenna technologies have evolved in recent years, including spatial diversity and spatial multiplexing (MIMO), and the challenges to improve signal quality and throughput. <br style="clear: both;"/>
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			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210603655]]></guid>
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		<item>
			<title><![CDATA[Oct 23 2008 02:00PM -- Best Practices of Top-gun Engineering Managers]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=ee8696ab126fab6f2427ec1e8587ddf5]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210700225</pheedo:origLink>
			<description><![CDATA[Based on a study of over 1,200 IC projects, this webinar introduces you to eight best practices of product development organizations. Managers leading these teams consistently execute and deliver on-time and within budget&amp;#8212;even on their most complex IC projects. Learn how they accurately determine IC design complexity; determine the most aggressive, yet achievable, IC project plans; quantify schedule risk and calibrate it against industry norms; and compare development productivity to the industry's best-in-class.<br style="clear: both;"/>
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			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210700225]]></guid>
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			<title><![CDATA[Oct 28 2008 01:00PM -- Debugging and Integrating MIPI DigRF-enabled ICs in LTE and WiMAX&amp;#8482; Mobile Devices]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=767756884c317ddd9beb72242f689207]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210603782</pheedo:origLink>
			<description><![CDATA[This webcast will review the basic characteristics found in most embedded high speed serial links, such as link and protocol layers, power management , encoding schemes, and will articulate how these digital domain mechanisms influence testing RFIC transmit and receive paths -- driving the need for cross domain test environments. <br style="clear: both;"/>
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<img src="http://www.pheedo.com/feeds/tracker.php?i=767756884c317ddd9beb72242f689207" style="display: none;" border="0" height="1" width="1" alt=""/>]]></description>
			<guid isPermaLink="false"><![CDATA[http://www.techonline.com/learning/livewebinar/210603782]]></guid>
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		<item>
			<title><![CDATA[Dec 3 2008 01:00PM -- Making Those Difficult Electronic Control Measurements Webcast]]></title>
			<link><![CDATA[http://www.pheedo.com/click.phdo?i=6ab08368dcbd9227bb27261d17e2d98f]]></link>
			<pheedo:origLink>http://www.techonline.com/learning/livewebinar/210605574</pheedo:origLink>
			<description><![CDATA[Today, transportation vehicles, aerospace/defense, and industrial control products use Electronic Control Units (ECUs) to manage motion via device drivers connected to inductive loads in harsh applications. ECU drivers are sophisticated and create design validation and testing challenges. This presentation will discuss these unique testing challenges, and describes effective methods to address them. <br style="clear: both;"/>
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