Overview:
Measurements of dynamic WiMAX burst signals can be a complex task. In this presentation you will be given an overview of WiMAX 802.16 standards, ODFM and ODFMA modulation techniques, and the key features in the P-Series power meter that make accurate efficient measurements easier than ever. Primarily focusing on the TDD environment, you will learn how to measure CCDF and efficiently capture the power level in the Preamble, Downlink, Uplink, and RTG modes.
Who should view this webcast:
Product design engineers, test engineers, metrology engineers and test system designers for Microwave and RF products or components.
Giveaway:
Registrants who complete the feedback form by January 24, 2008 will be entered in a drawing to win one of two $75 Amazon.com gift certificates. Official Rules
Presenters: David Lynch and Chin-Aik Lee, Agilent Technologies
David Lynch
David Lynch brings a wealth of over 22 years of experience with Agilent Technologies test and measurement instrumentation. He has worked as an Agilent engineer for Regional Sales Support, Technical Application Support, and Service Support for many years. He has developed and presented many seminars and training classes world-wide, including RF Network Analysis for both Scalar and Vector measurements, Antenna measurements, Radar Cross Section measurements, and metrology. He has been instrumental in developing information systems and user interfaces for high speed production RF semiconductor measurement test equipment. He has also been a service support manager, R&D project manager, quality manager, and order fulfillment NPI manager for Agilent.
Chin Aik Lee is an application engineer with the Basic Instruments Division of Agilent Technologies. His focus is on power meter and power sensor products. He previously worked as test engineer in Agilent's Signal Analysis Division.
*WiMAX is a trademark of the WiMAX Forum
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