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	Title		Author/Company		Published
	Build Locally, Source Globally: Find Your Next Competitive Advantage		PartMiner		Nov 2009 White Paper
	Why NI CompactDAQ?		National Instruments		Oct 2009 White Paper
	Designing Automated Test Systems		National Instruments		Oct 2009 White Paper
	Spread Spectrum Clock Generator (SSCG) User Guide		Fujitsu Microelectronics		Sep 2009 White Paper
	Hierarchical Timing Closure and Time Budgeting Principles		Ashis Maitra Freescale Semiconductor		Sep 2009 White Paper
	REACHing Asia, Continued		DaeYoung Park Young & Global Partners		Sep 2009 White Paper
	Scanburst: A Scan Infrastructure		Mentor Graphics		Aug 27, 2009 Mentor Graphics Technical Library
	BIST Techniques for Delay and Jitter		Mentor Graphics		Aug 18, 2009 Mentor Graphics Technical Library
	Why Use Embedded Test for High-Speed Serial I/Os?		Mentor Graphics		Aug 18, 2009 Mentor Graphics Technical Library
	Embedded Path to Low DPM		Mentor Graphics		Aug 18, 2009 Mentor Graphics Technical Library
	How the voltage reference affects ADC performance, Part 2		Miro Oljaca and Bonnie Baker Texas Instruments		Aug 2009 Technical Paper
	Boost Backlight LED Driver		Jim Christensen Maxim Integrated Products		Jul 27, 2009 Application Note
	Proactive vs. Reactive Approaches to Obsolescence Management		SiliconExpert Technologies		Jul 2009 White Paper
	Mobile WiMAX Throughput Measurements using R&S CMW270		Steffen Heuel and Heinz Mellein Rohde & Schwarz		Jul 2009 Application Note
	Measuring the S-Parameters of a 50 to 75 Ohm impedance matching device using the Vector Network Analyzer ZVA		Kenneth Rasmussen Rohde & Schwarz		Jul 2009 Application Note

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