CMP - United Business Media TechOnline
All Articles Products Courses Papers VirtuaLabs Webinars Web



 
LoginRegister
      TechOnline > Learning >  Technical Paper
Technical Papers
Fundamentals of RF and Microwave Power Measurements: Introduction to Power, History, Definitions, International Standards and Traceability

Click to Download
pdf logo
Application Note 1449-1
550 KB (32 pages)
April 17, 2003
 

Ian Messer and John Mink
Agilent Technologies

This application note, Part 1 of the Fundamentals of RF and Microwave Power Measurements, introduces the historical basis for power measurements, and provides definitions for average, peak, and complex modulations. This application note overviews various sensor technologies needed for the diversity of test signals. It describes the hierarchy of international power traceability, yielding comparison to national standards at worldwide national measurement institutes (NMIs) like the U.S. National Institute of Standards and Technology. Finally, the theory and practice of power sensor comparison procedures are examined with regard to transferring calibration factors and uncertainties.

 
Rate this paper
WORSE | BETTER
1 2 3 4 5

submit a paper

Agilent Technologies
   

TECH PAPER
1. System ACE Configuration Solution for Xilinx FPGAs

TECH PAPER
2. Use Rowley CrossWorks and the MAXQ3120 Evaluation Kit to Create a Light Meter Application

TECH PAPER
3. Interface Products Design Guide

TECH PAPER
4. Get a Grip on Multimedia PMP Demands with the Right Processor Selection