DESCRIPTION
This course discusses how a Workbench Faraday Cage and a hybrid balun are used for measuring the emissions caused by common-mode voltage and shows the improvement obtainable with a reduced-noise MCU. Subsequently, the course describes a technique recently developed by Renesas for decreasing the common-mode noise that can be applied to the package of an LSI device and the layout of the high- and low-side power distribution lines on a printed circuit board.

PREREQUISITES
None

INTENDED AUDIENCE
Engineers

ESTIMATED TIME
30 minutes

AUTHOR