Overview:
The Time Domain Reflectometer (TDR) has long been the standard measurement tool for characterizing and troubleshooting physical layer devices. With the push towards higher speed differential signaling, and the need for more accurate characterization and modeling of differential interconnects (such as cables, connectors and printed circuit boards) the Vector Network Analyzer (VNA) is becoming more common in signal integrity labs as well. The differences between the TDR and VNA will be discussed and used to show how limitations in accuracy, dynamic range, spatial resolution, frequency coverage (faster rise times) effect characterization and modeling typical structures.
Giveaway:
Registrants who completely fill out the feedback form by April 29, 2008 will be eligible to win one of two autographed copies of Eric Bogatin's book, "Signal Integrity Simplified". Official Rules
Duration: 1 hour
Who Should Attend:
R&D designers, engineers, and project managers working on high-speed digital designs; who spend a significant amount of time in the debug and validation phase dealing with signal integrity related problems in their designs.
Presenter:
Robert Schaefer - Technical Leader and and R&D Project Manager for the Signal Integrity Group, Component Test Division, Agilent Technologies
His responsibilities include project management, planning, and strategy. Previously he worked as a Solution Planner in one of Agilent Technologies' Marketing Solutions Units. For more than 20 years of his career he worked in Research and Development as a designer and project manager. He has worked in several divisions of Hewlett Packard and now Agilent Technologies. His design and management experience covers the breadth of GaAs IC and microcircuit design, RF and analog circuit design, instrument firmware and computer aided test software, device modeling and design of modeling systems, microwave and RF CAD products, and signal integrity. Prior to joining HP in 1976, he completed his BSEE and MSEE degrees from the University of Missouri at Rolla.
Mike Resso - Signal Integrity Measurement Specialist, Component Test Division, Agilent Technologies
He has over twenty years of experience in the test and measurement industry. His background includes the design and development of electro-optic test instrumentation for aerospace and commercial applications. His most recent activity has focused on the complete multiport characterization of high speed digital interconnects using Time Domain Reflectometry and Vector Network Analysis. He has authored over 25 professional publications and received one US patent. Mike received a Bachelor of Science degree in Electrical and Computer Engineering from University of California and has twice received the Agilent "Spark of Insight" Award for his contribution to the company.
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