Overview:
Engineers and scientists face many difficulties when characterizing advanced semiconductor processes. Measurement challenges such as making parallel measurements, improving QSCV and MFCV measurement accuracy and preventing inadvertent device damage (to name just a few) are not adequately addressed by previous measurement solutions. In addition, these challenges are set against the backdrop of an ongoing need to reduce test costs.
In this webcast you will learn some powerful new solutions that can help to solve these and other issues, and that can also provide improved flexibility, accuracy, and ease-of-use. You will also learn how to optimize cost versus performance by tailoring the solutions shown to meet your exact measurement needs.
Who should view this webcast:
Process engineers Device engineers Modeling engineers Reliability engineers Scientists and university researchers involved in the characterization of semiconductor and nanoscale devices
Giveaway:
Registrants who complete the feedback form by January 24, 2008 will be entered in a drawing to win one of two $75 Amazon.com gift certificates. Official Rules
Presenter:
Alan Wadsworth, Agilent Technologies
Alan has bachelors and masters degrees in electrical engineering from the Massachusetts Institute of Technology. He also has an MBA from Santa Clara University. He is currently the marketing communications (MARCOM) manager for Agilent's semiconductor test division.
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