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Test & Measurement

Title	Author/Company	Published
Design Tip: Simulating "Raw" Error Vector Magnitude (EVM) for a Quick Measure of a Circuit's EVM Performance	Agilent Technologies	May 2009 Technical Paper
Five Things That Can Save You Time When Using an Economy Oscilloscope	Agilent Technologies	Apr 2009 Application Note
Oscilloscope Display Quality Impacts Ability to View Subtle Signal Details	Agilent Technologies	Mar 2009 Application Note
Multithreading in Agilent VEE 9.0	Agilent Technologies	Jan 2009 White Paper
Agilent LTE Reference Vector	Agilent Technologies	Dec 2008 White Paper
3GPP Long Term Evolution: System Overview, Product Development, and Test Challenges	Agilent Technologies	May 2008 Application Note
FPGA-Based Controller Enables Precise Chemical Analysis	Robert Henderson Agilent Technologies	Apr 07, 2008 Xcell Journal Article
Evaluating Oscilloscopes for Best Signal Visibility	Agilent Technologies	Feb 2008 Application Note
A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses	Min-Jie Chong Agilent Technologies	Apr 30, 2007 Application Note
Automated USB 2.0 Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform	Agilent Technologies	Jan 31, 2007 Application Note
Measurement Cores Shorten Virtex-5 Development	Brad Frieden Agilent Technologies	Oct 2006 Xcell Journal Article
HDMI Sink and Source Compliance Test and Characterization	Agilent Technologies	Oct 25, 2006 Application Note
Automated PCI Express Receiver Compliance Test and Characterization with the Agilent N5990A Software Platform	Agilent Technologies	Aug 28, 2006 Product Note
Calibrated Jitter, Jitter Tolerance Test and Jitter Laboratory with the Agilent J-BERT N4903A	Agilent Technologies	Jul 13, 2006 Application Note
Debugging Embedded Designs with a Mixed Signal Oscilloscope	Johnnie Hancock Agilent Technologies	Apr 07, 2006 2006 Embedded Systems Conference Paper
Second Generation PCI Express Testing with the J-BERT N4903A High-Performance Serial BERT	Agilent Technologies	Jan 30, 2006 Application Note
Real-Time Analysis of DSP Designs	Scott Ferguson Agilent Technologies	Dec 01, 2005 Xcell Journal Article
Second Generation PCI Express Testing with the N4903A High-Performance Serial BERT (J-BERT)	Agilent Technologies	Nov 14, 2005 Product Paper
Advanced Memory Buffer (AMB), Characterization of Timing and Voltage Specifications	Rainer Plitschka Agilent Technologies	Sep 22, 2005 Product Paper
Eye Characterization on Idle and Framed Data Traffic: the Bit Recovery Mode	Agilent Technologies	Sep 21, 2005 Product Paper
Electromagnetic Compatibility (EMC): Precompliance Testing and Troubleshooting	Kenneth Wyatt Agilent Technologies	Sep 15, 2005 2005 ESC Boston Paper
Using a Function Generator to Create Pulse-Width Modulation (PWM) Waveforms	Bill Griffith Agilent Technologies	Jul 21, 2005 Technology Paper
Total Jitter Measurement at Low Probability Levels, Using Optimized BERT Scan Method	Marcus Mueller, Ransom Stephens, and Russ McHugh Agilent Technologies	Jul 11, 2005 Technology Paper
Speed FPGA Debug with Mixed-Signal Oscilloscopes	Joel Woodward Agilent Technologies	Jul 11, 2005 Xcell Journal Article
Evaluating Oscilloscope Vertical Noise Characteristics	Johnnie Hancock Agilent Technologies	Jul 10, 2005 Product Paper
Physical Layer Testing of Passive Optical Network (PON) Modules	Agilent Technologies	Jun 30, 2005 Product Paper
Improve Your Ability to Capture Elusive Events: Why Oscilloscope Waveform Update Rates are Important	Johnnie Hancock Agilent Technologies	Jun 22, 2005 Product Paper
Performing W-CDMA Tx Dynamic Power Measurements Using the Agilent 8960 Wireless Communications Test Set	Agilent Technologies	Jun 15, 2005 Technology Paper
A Comparison of Leading Switch/Measure Solutions	Brian Wood Agilent Technologies	Jun 14, 2005 Product Paper
6 Tips for Successful Logic Analyzer Probing	Brock J. LaMeres and Kenneth Johnson Agilent Technologies	Jun 13, 2005 Technology Paper
How to Measure Digital Baseband and IF Signals Using Agilent Logic Analyzers with 89600 Vector Signal Analysis Software	Scott Ferguson Agilent Technologies	Jun 07, 2005 Product Paper
Next Generation I/O Bus PCI-Express BER Test Solution	Agilent Technologies	May 25, 2005 Product Paper
Side-by-Side Comparison: Agilent N5700 System DC Source and Xantrex XFR DC Power Supply	Kevin Cavell Agilent Technologies	May 24, 2005 Product Paper
Using LAN in Test Systems: Applications	Dave Gladfelter Agilent Technologies	May 17, 2005 Technology Paper
Next-generation Test Systems: Advancing the Vision with LXI	Grant Drenkow Agilent Technologies	Apr 26, 2005 Product Paper
Validating Transceiver FPGAs Using Advanced Calibration Techniques	Mike Resso Agilent Technologies	Apr 21, 2005 Technology Paper
Moving from the HP 3852A Data Acquisition System to the Agilent 34980A Switch/Measure Unit	Agilent Technologies	Apr 05, 2005 Product Paper
Improving Chromatic Dispersion and PMD Measurement Accuracy	Michael Kelly Agilent Technologies	Apr 05, 2005 Product Paper
Investigating Microvia Technology for 10 Gbps and Higher Telecommunications Systems	Mike Resso Agilent Technologies	Apr 04, 2005 Technology Paper
Using LAN in Test Systems: Setting Up System I/O	Dave Gladfelter Agilent Technologies	Mar 29, 2005 Technology Paper
W-CDMA Dynamic Power Analysis Using the Agilent 8960 Wireless Communications Test Set	Agilent Technologies	Mar 17, 2005 Product Paper
EGPRS Test: Meeting the Challenge of 8PSK Modulation	Dave Dunne Agilent Technologies	Feb 28, 2005 Technology Paper
Selecting an I/O Architecture for Your FPGA Design	Brock J. LaMeres Agilent Technologies	Feb 25, 2005 Technology Paper
Concepts of High Speed Downlink Packet Access: Bringing Increased Throughput and Efficiency to W-CDMA	Marta Iglesias Agilent Technologies	Feb 17, 2005 Technology Paper
Oscilloscope Display Quality Impacts Ability to Uncover Signal Anomalies: Agilent 6000 Series Scope vs. LeCroy WaveSurfer 400 Series Scope	Johnnie Hancock Agilent Technologies	Feb 17, 2005 Product Paper
Oscilloscope Display Quality Impacts Ability to Uncover Signal Anomalies: Agilent 6000 Series Scope vs. Tektronix TDS3000 Series Scope	Johnnie Hancock Agilent Technologies	Feb 17, 2005 Product Paper
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly	Kevin Cavell Agilent Technologies	Feb 04, 2005 Product Paper
How to Convert from a Sorensen DLM to an Agilent N5700	Kevin Cavell Agilent Technologies	Jan 28, 2005 Product Paper
Deep Memory Oscilloscopes: The New Tools of Choice	Johnnie Hancock Agilent Technologies	Jan 21, 2005 Product Paper
WiMAX Concepts and RF Measurements	Allen Henley Agilent Technologies	Jan 04, 2005 Technology Paper
Spectrum Analysis Basics	Agilent Technologies	Jan 04, 2005 Technology Paper
Test-System Development Guide	Dave Gladfelter Agilent Technologies	Dec 28, 2004 Technology Paper
Using SCPI and Direct I/O vs. Drivers	Dave Gladfelter Agilent Technologies	Dec 13, 2004 Technology Paper
Understanding Measurement of 1xEV-DO Access Terminals	Noah Schmitz Agilent Technologies	Dec 10, 2004 Technology Paper
Benefits of a Switch/Measure Unit for Data Acquisition and Electronic Functional Test	Brian Wood Agilent Technologies	Dec 07, 2004 Technology Paper
Test System Signal Switching	Werner Haussmann Agilent Technologies	Nov 11, 2004 Technology Paper
Trends in Programmable Medium Power System DC Power Supplies	Gary Raposa Agilent Technologies	Oct 28, 2004 Technology Paper
Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test	Ed Brorein Agilent Technologies	Oct 22, 2004 Technology Paper
Increase Automotive ECU Test Throughput	Ed Brorein Agilent Technologies	Oct 22, 2004 Technology Paper
Increase DC-input Battery Adapter Test Throughput By Several-fold	Ed Brorein Agilent Technologies	Oct 22, 2004 Technology Paper
Using LAN in Test Systems: PC Configuration	Dave Gladfelter Agilent Technologies	Oct 19, 2004 Technology Paper
Using USB in the Test and Measurement Environment	Dave Gladfelter Agilent Technologies	Oct 19, 2004 Technology Paper
The Dual Clock Gbit Chip Test	Agilent Technologies	Oct 18, 2004 Product Paper
Identifying Sources of Jitter	Johnnie Hancock Agilent Technologies	Oct 2004 Euro DesignCon 2004 Paper
Radar Distance Test to Airborne Planes	Agilent Technologies	Oct 14, 2004 Product Paper
How your 3499A/B/C Test System Benefits From Upgrading to the New 34980A Switch/Measure/Control System	Darlene Carpenter Agilent Technologies	Oct 05, 2004 Product Paper
Side-by-Side Comparison: Agilent N5700 System DC Source and Sorensen DLM Power Supply	Kevin Cavell Agilent Technologies	Oct 05, 2004 Product Paper
Advanced Jitter Generation and Analysis up to 3.35 Gbps with the Agilent 81134A Pulse Pattern Generator and 86100C Infiniium Wide-Bandwidth DCA-J Oscilloscope	Agilent Technologies	Oct 04, 2004 Product Paper
Using LAN in Test Systems: Network Configuration	Dave Gladfelter Agilent Technologies	Sep 14, 2004 Technology Paper
A Low Cost Alternative to VXI and PXI	Tom Conway Agilent Technologies	Sep 10, 2004 Product Paper
4 More Hints for Making Better Frequency Counter Measurements	Agilent Technologies	Sep 01, 2004 Technology Paper
Network Analyzer Basics	Dave Ballo Agilent Technologies	Aug 31, 2004 Technology Paper
Making Precompliance Conducted and Radiated Emissions Measurements with PSA Series Spectrum Analyzers	Agilent Technologies	Aug 10, 2004 Technology Paper
How to Use the Agilent N6700 Series Modular Power System to Replace an Agilent 662xA	Ed Brorein Agilent Technologies	Aug 02, 2004 Product Paper
Using LAN in Test Systems: The Basics	Dave Gladfelter Agilent Technologies	Jul 29, 2004 Technology Paper
Magneto-Optical Disk Drive Research	Agilent Technologies	Jul 28, 2004 Product Paper
Vector Signal Analysis Basics	Agilent Technologies	Jul 14, 2004 Technology Paper
Agilent 16760A Logic Analysis Module Triggering	Art Porter Agilent Technologies	Jun 28, 2004 Product Paper
8 Hints for Getting More from Your Function Generator	Bill Griffith Agilent Technologies	Jun 26, 2004 Technology Paper
Next Generation of WLAN Manufacturing Test Solutions	Helen Mills Agilent Technologies	May 28, 2004 Technology Paper
USB 2.0 Compliance Testing with Agilent Infiniium	Rebecca Suemnicht and Tokuyoshi Rin Agilent Technologies	May 27, 2004 Product Paper
Ultra-Wideband Communication RF Measurements	Pete Cain Agilent Technologies	May 21, 2004 Technology Paper
Utilizing TDR and VNA Data to Develop 4-port Frequency Dependent Models for Simulation	Mike Resso Agilent Technologies	May 19, 2004 Technology Paper
Developing an EGPRS Mobile Manufacturing Test Plan	Agilent Technologies	May 18, 2004 Technology Paper
Fundamentals of RF and Microwave Noise Figure Measurements	Glenn Howard Agilent Technologies	Mar 23, 2004 Technology Paper
Debugging USB 2.0 for Compliance: It's Not Just a Digital World	Gregg Buzard, Bryan Kantack FuturePlus Systems and Agilent Technologies	Mar 08, 2004 Application Note
Data Throughput Analysis on IS-2000 Wireless Networks	Agilent Technologies	Feb 26, 2004 Technology Paper
Testing High Speed Serial IO Interfaces Based on Spectral Jitter Decomposition	Rainer Plitschka and Bernd Laquai Agilent Technologies	Feb 04, 2004 DesignCon 2004 Conference Paper
Dynamic Power Measurements for cdma2000 on the Agilent 8960 Wireless Test Set	Agilent Technologies	Jan 13, 2004 Product Paper
Jitter Generation and Jitter Measurements with the Agilent 81134A Pulse Pattern Generator and 54855A Infiniium Oscilloscope	Agilent Technologies	Dec 15, 2003 Product Paper
Choosing the Right DC System Power Supply	Agilent Technologies	Nov 14, 2003 Technology Paper
Fundamentals of RF and Microwave Power Measurements: An Overview of Agilent Instrumentation for RF/Microwave Power Measurements	Ian Messer and John Mink Agilent Technologies	Jun 09, 2003 Technology Paper
Fundamentals of RF and Microwave Power Measurements: Power Measurement Uncertainty per International Guides	Ian Messer and John Mink Agilent Technologies	Jun 04, 2003 Technology Paper
Fundamentals of RF and Microwave Power Measurements: Power Sensors and Instrumentation	Ian Messer and John Mink Agilent Technologies	Apr 21, 2003 Technology Paper
Fundamentals of RF and Microwave Power Measurements: Introduction to Power, History, Definitions, International Standards and Traceability	Ian Messer and John Mink Agilent Technologies	Apr 17, 2003 Technology Paper
Logic Analyzer Probing Techniques for High-Speed Digital Systems	Kenny Johnson Agilent Technologies	Mar 24, 2003 Technology Paper
Making 802.11g Transmitter Measurements	Ben Zarlingo Agilent Technologies	Feb 21, 2003 Technology Paper
Jitter Analysis Techniques for High Data Rates	Agilent Technologies	Feb 03, 2003 Product Paper
Using a Function/Arbitrary Waveform Generator to Generate Pulses	Bill Griffith Agilent Technologies	Dec 13, 2002 Technology Paper
Understanding Oscilloscope Frequency Response and Its Effect on Rise-Time Accuracy	Agilent Technologies	Dec 01, 2002 Technology Paper
Restoring Confidence in Your High-Bandwidth Probe Measurements	Agilent Technologies	Nov 01, 2002 Application Note
Addressing VoIP Speech Quality with Non-Intrusive Measurements	John Anderson Agilent Technologies	Sep 12, 2002 Technology Paper
Debugging a PCI Bus with a Mixed-Signal Oscilloscope	Agilent Technologies	Sep 01, 2002 Application Note
Connected Simulation and Test Solutions Using the Advanced Design System	Greg Jue Agilent Technologies	Aug 26, 2002 Technology Paper
Selecting Temperature Transducers for Data Acquisition Systems	Bill Griffith Agilent Technologies	Aug 26, 2002 Technology Paper
IEEE 802.11 Wireless LAN PHY Layer (RF) Operation and Measurement	Pete Cain Agilent Technologies	Apr 01, 2002 Technology Paper
Testing and Troubleshooting Digital RF Communications Receiver Designs	Agilent Technologies	Mar 25, 2002 Technology Paper
9 Hints for Making Better Measurements Using RF Signal Generators	Agilent Technologies	Mar 19, 2002 Technology Paper
Saving Time with Multiple-Channel Signal Integrity Measurements	Art Porter Agilent Technologies	Mar 14, 2002 Product Paper
System Cabling Errors and DC Voltage Measurement Errors in Digital Multimeters	Dave Heintz Agilent Technologies	Jan 31, 2002 Technology Paper
Resistance; DC Current; AC Current; and Frequency and Period Measurement Errors in Digital Multimeters	Dave Heintz Agilent Technologies	Jan 31, 2002 Technology Paper
AC Voltage Measurement Errors in Digital Multimeters	Dave Heintz Agilent Technologies	Jan 31, 2002 Technology Paper
Essential Components of Data Acquisition Systems	Bill Griffith Agilent Technologies	Jan 11, 2002 Technology Paper
8 Hints for Making Better RF Counter Measurements	Agilent Technologies	Apr 10, 2001 Technology Paper
Digital Modulation in Communications Systems: An Introduction	Agilent Technologies	Mar 14, 2001 Technology Paper
Signal Generator Spectral Purity	Agilent Technologies	Feb 20, 2001 Technology Paper
10 Hints for Making Successful Noise Figure Measurements	Glenn Howard Agilent Technologies	Nov 21, 2000 Technology Paper
De-Embedded S-Parameters to Characterize Surface Mount RF Components	Michael Knox Agilent Technologies	Sep 2000 2000 OSEE Paper
Simulation of Jittering Synchronization Signals for Video Interfaces	Agilent Technologies	May 2000 Product Paper
10 Hints for Using Your Power Supply to Decrease Test Time	Agilent Technologies	Oct 1999 Technology Paper
Optimizing Test Coverage—Recommended Design Rules for an X-ray	Agilent Technologies	Mentor Graphics Technical Library
System Issues in Boundary-Scan Board Test	Agilent Technologies	Mentor Graphics Technical Library
Design for Testability—Test for Designability	Agilent Technologies	Mentor Graphics Technical Library
10 Practical Tips You Need to Know About Your Power Products	Agilent Technologies	Technology Paper


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