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	Title		Author/Company		Published
	Samsung 68nm 1GB DDR2 SDRAM (K4T1G084QD-ZCE6) Overview		Gregory Quirk Semiconductor Insights		Mar 06, 2008 Insight Report
	Automated Aerial Image-Based CD Metrology Initiated by Pattern Marking with Photomask Layout Data		Grant Davis et al. Mentor Graphics, Samsung Electronics, and Carl Zeiss		May 11, 2007 Mentor Graphics Technical Paper Library
	Robust Double Exposure Flow for Memory		JW Park, Sungsoo Shu, Insung Kim, and Youngsuk Kang Mentor Graphics and Samsung		Apr 11, 2006 Mentor Graphics Technical Library
	Re-Configurable SoC with Embedded FPGA: "Application Independent Standard Part"		Bob Burke Samsung Electronics		Apr 26, 2003 2003 Embedded Systems Conference


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