Aman Arora et al
Freescale Semiconductor

This paper acquaints the reader with the basic concepts of Flash memories, discusses the various faults/disturbances that occur in Flash memories, develops the reader's understanding into how modified March algorithms can be used to test these disturbances, and finally, provides a perspective into how Flash memories are deployed and tested in embedded applications—SoCs. An Appendix has been added at the end for a better understanding of the basic concepts of Flash memories.