CMP - United Business Media TechOnline
All Articles Products Courses Papers VirtuaLabs Webinars Web



 
LoginRegister
      TechOnline > Electronics Company Directory > Technical Paper
Technical Papers
On-chip Timing Uncertainty Measurements on IBM Microprocessors

Click to Download
pdf logo
White Paper
470 KB (8 pages)
July 2007
 

R. Franch et al
IBM

Timing uncertainty in microprocessors is comprised of several sources including PLL jitter, clock distribution skew and jitter, across chip device variations, and power supply noise. The on-chip measurement macro called SKITTER (SKew+jITTER) was designed to measure timing uncertainty from all combined sources by measuring the number of logic stages that complete in a cycle. This measure of completed delay stages has proven to be a very sensitive monitor of power supply noise, which has emerged as a dominant component of timing uncertainty. This paper describes the Skitter measurement experiences of several IBM microprocessors including PPC970MP, XBOX360, CELL Broadband Engine, and POWER6 microprocessors running different workloads.

 
Rate this paper
WORSE | BETTER
1 2 3 4 5

submit a paper
Follow Tech Papers

IBM
   

TECH PAPER
1. Real-time VT5 Model Coverage Calculations During OPC Simulations

TECH PAPER
2. LIN 2.0 Compliant Driver Using the PIC16FXXX Family Microcontrollers

TECH PAPER
3. Verification Management: Major Challenges

TECH PAPER
4. Requirements Tracing