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Beyond IR Drop: Dynamic Voltage Droops and Total Power Integrity

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March 31, 2008
 

Raj Nair and Donald Bennett
Anasim

This paper sheds light on key differences such as voltage droops and noise wave propagation resulting from on-chip load interaction with power network impedance. It also discusses how total power integrity may be rigorously inspected through rapid analyses and physics-based simulations with corresponding benefits to system-on-a-chip (SoC) cost and time-to-market.

 
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