CMP - United Business Media TechOnline
All Articles Products Courses Papers VirtuaLabs Webinars Web



 
LoginRegister
      TechOnline > Electronics Company Directory > Technical Paper
Technical Papers
Statistical Pattern Recognition

Click to Download
pdf logo
2000 Online Symposium for Electronics Engineers (OSEE)
76 KB (9 pages)
September 2000
 

Richard O. Duda
San José State University

This paper presents the basic concepts of statistical pattern recognition as a formalization of the common-sense approach to comparing an unclassified input pattern to a standard pattern or "template." The two most basic problems of statistical pattern recognition are how to measure goodness of fit and how to create templates. Statistical concepts provide answers to both questions. A simple Gaussian model is used to obtain a solution that is optimal under certain assumptions. Although limited to relatively easy problems, this model shows how statistical methods provide a firm mathematical foundation for more advanced techniques.

 
Rate this paper
WORSE | BETTER
1 2 3 4 5

submit a paper

Online Symposium for Electronics Engineers (OSEE)
   

TECH PAPER
1. System ACE Configuration Solution for Xilinx FPGAs

TECH PAPER
2. Use Rowley CrossWorks and the MAXQ3120 Evaluation Kit to Create a Light Meter Application

TECH PAPER
3. Get a Grip on Multimedia PMP Demands with the Right Processor Selection

TECH PAPER
4. Interface Products Design Guide