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Event	Date/Time	Length

LTE Device Test Challenges - The Importance of the "Channel" Agilent Technologies	Jan 13, 2010 10AM PT / 1PM ET / 6PM GMT	60 min.
New 5Hz-to-3GHz VNA for LF measurement applications - PDN, sensor and more Agilent Technologies	Jan 20, 2010 10AM PT / 1PM ET / 6PM GMT	60 min.


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