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Considerations for 802.11ax Device Testing: High Efficiency Wireless Testing

Original Air Date: Apr 19, 2017 Webinar
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Although the creation of new wireless standards promises many benefits to us as consumers—they introduce new design and test challenges. One exciting new technology is 802.11ax, also known as High-Efficiency Wi-Fi (HEW). HEW is an evolution to 802.11ac, and is expected to become a mainstream Wi-Fi technology by 2019. Designed to deliver better Wi-Fi performance in outdoor environments HEW uses several technologies that are new to Wi-Fi including narrower sub-carrier spacing, higher-order modulation schemes (1024-QAM), and Orthogonal Frequency Division Multiple Access (OFDMA). This presentation will provide a basic overview of the new features of 802.11ax, compare the standard to 802.11ac, and explain several practical considerations that it introduces for RF design and test.

Speaker

Brian Glass, Product Marketing Manager for RF Test Software, National Instruments

Brian Glass is the product marketing manager for RF test software at National Instruments in Austin, TX. He holds a B.S. in physics from the University of Minnesota and has 5 years of experience in the test and measurement industry. The last 3 years he has focused on characterization and production test of RF semiconductor devices for cellular, connectivity, and IoT, including power amplifiers, front end modules, and transceivers.

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