Debugging EMI Problems Using a Real-Time Oscilloscope & Near-Field Probes
Electromagnetic interference is increasingly becoming a problem in complex systems that must interoperate in both high speed digital and RF domains. When failures due to EMI occur it is often difficult to track down the sources of such failures using standard test receivers and spectrum analyzers.
This session will present a method of evaluating EMI in real time using a near field probe. The unique ability of real-time spectrum analysis and synchronous time domain signal acquisition to capture transient events in the time and frequency domains reveals details about the sources of EMI such as power supply switching and poor grounding that can quickly lead to mitigation strategies. The details of near-field EMI measurements will be presented along with a measurement example.
What you will learn:
- Common EMI problems
- Methods of evaluating EMI in real time using a near field probes
- How to capture transient events synchronously in the time and frequency domains
Mike Schnecker, Business Development Manager, Rohde & Schwarz
Mike Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering. He has 22 years of experience in the test and measurement industry in applications, sales and product development roles, and has specialized in signal integrity applications including jitter using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers.