True Differential S-Parameter Measurements

Overview:
Differential structures such as backplanes and cables are the primary means for transmitting high speed serial data signals. Signal integrity of these systems is determined by the characteristics of the media such as insertion loss, crosstalk, and differential to common mode conversion. Complete measurement of the mixed mode S-Parameters is often performed by transforming single-ended S-Parameters and assuming that the system is linear. In some cases, linearity cannot be assumed such as where active components are used.

This session will describe how to measure true differential S-Parameters which can be measured even in the presence of non-linear elements.

What you will learn:

• Signal Integrity characteristics of high speed serial data signals
• Linear versus non-linear system assumptions
• How to measure true differential s-parameters

Presenter:
Chris Scholz, Ph.D, Product Manager, Rohde & Schwarz
Chris Scholz has a Ph.D. (Electrical Engineering) and an MS from Georgia Tech, in addition to an MS from the TU Carolo-Wilhelmina in Braunschweig. Prior to joining Rohde & Schwarz he worked as a Field Applications Engineer at LeCroy specializing in high-speed serial standards and signal integrity tests. He's also worked at Intel, leading product development in integrated silicon photonics devices, and as a research faculty at Georgia Tech working on millimeter Wave technology and equalizer ICs for fiber-optical communications systems.