Synchronous Time and Frequency Domain Analysis of Embedded Systems

Overview:
Embedded systems increasingly employ a combination of low speed serial, analog voltages and RF communications which are tightly synchronized in time. This session will discuss the background of performing time and frequency domain analysis on these systems with example measurements on a digitally controlled RF transmitter.

• The challenges of debugging embedded systems
• Frequency domain analysis and FFT basics
• Time gating, Dynamic range and Triggering considerations
• PLL locking measurement example

Presenter:
Mike Schnecker, Business Development Manager, Rohde & Schwarz
Mike Schnecker has a BS from Lehigh University and an MS from Georgia Tech, both in electrical engineering. He has 22 years of experience in the test and measurement industry in applications, sales and product development roles, and has specialized in signal integrity applications including jitter using oscilloscopes and other instruments. Prior to joining Rohde & Schwarz, Mr. Schnecker held positions at LeCroy and Tektronix. While at LeCroy, he was responsible for the deployment of the SDA series of serial data analyzers.