New Power Device Measurement Solutions (1500 A / 10 kV)
Modern power devices and materials (such as HVMOS, GaN and SiC) present many difficult measurement challenges that require new methods and equipment. This web seminar will show new solutions and techniques from Agilent Technologies and Cascade Microtech that make high power device testing at currents and voltages up to 1500 A and 10 kV easier than ever before. Learn how you can safely and efficiently characterize both packaged and on-wafer power semiconductor devices with unprecedented speed and accuracy.
Who should view this webcast:
Academia: Professors, educators, and students involved with high power semiconductor device research.
Industry: Test engineers, design engineers, product engineers, quality engineers, failure analysis engineers, reliability engineers, scientists and researchers involved with high power semiconductor device characterization and test.
Alan Wadsworth, Agilent Technologies
Alan Wadsworth is the North and South American Market Development Manager for Agilent's semiconductor test division. Alan holds bachelors and masters degrees in electrical engineering from the Massachusetts Institute of Technology and an MBA from Santa Clara University. Alan has over 25 years of experience in the semiconductor industry in both design and test.
Swe, Product Marketing Manager for the integrated systems at Cascade Microtech,
Toe specializes in high-power device testing at wafer level. Prior to joining Cascade Microtech, ToeNaing spent over eight years as a device modeling consultant at Agilent Technologies, Inc where he provided device modeling and characterization services to leading semiconductor foundries and research institutions. Toe Naing also founded the Semiconductor Measurement and Modeling Company (SMMC) in Singapore which provided innovative modeling solutions in the semiconductor industry. ToeNaing holds Master of Engineering (MEng) in Electrical Engineering from the Nanyang Technical university in Singapore.