Advanced Fault-Injection Methods for Automotive Safety Critical Systems
Safety is one of the biggest concerns of the automotive industry. Releasing a product with defects that could compromise safety can have enormous direct and indirect cost for an automotive OEM. Moreover, the new ISO 26262 standard is imposing more demanding requirements to the industry in order to increase the quality of safety critical systems. Fault-tolerance HW and SW mechanisms (e.g. redundancy, monitoring, diagnostics, recovery, etc) are often combined and used together in order to improve safety. Those mechanisms have to be tested on the system context under all operational conditions and corner cases. Typical corner cases very difficult to test are those produced when the underlying HW fails or the SW gets unexpectedly corrupted. Fault-injection methods are typically used to cover a subset of these tests, however there are quite some limitations on how effectively existing methods can be applied for a more extensive coverage.
In this webinar, Continental will describe the importance of fault-tolerance mechanism and fault-injection techniques for Automotive Tier-1's using as an example an Electronic Stability Control system. HW fault-tolerance mechanisms available in "state-of-the-art" Micro-Controller Units will be introduced by Freescale. Synopsys will disclose how Virtual Prototyping technology can be used to overcome many of the limitations of existing fault-injection techniques. Realistic fault-injection scenarios will be shown using a Freescale lock-step dual core virtual MCU model.
What attendees will learn:
- Fault-tolerance mechanism and fault-injection requirements for Automotive Tier-1's safety critical systems
- HW fault-tolerance mechanisms available in "state-of-the-art" Micro-Controller Units
- ISO 26262 requirements regarding fault-injection testing
- Overview of conventional fault-injection methods and their limitations
- Examples using realistic fault-injection scenarios of how Virtual Prototyping technology is used to:
- Non-intrusively inject soft-errors (e.g. memory corruption)
- Monitor and analyze HW and SW recovery mechanisms
Duration: ~ 45min
Who should attend:
SW testing engineers, project managers, SW Quality Assurance responsibles
Victor Reyes, Technical Marketing Manager, Synopsys
Responsible for Virtual Prototypes for Automotive, as part of the System-Level Solutions group in Synopsys. Prior to the Synopsys position he worked in the System-Design Methods Group in NXP Semiconductors and Philips Research. Victor has a PhD in Electronics and Telecommunication Engineering from University Las Palmas, Spain (2008).
Manfred Thanner, Technical Staff Systems Engineer, Freescale Semiconductor
Responsible for system level simulation in the Micro Controller Systems Group. Responsible for the development and deployment of virtual platforms in Freescale automotive and inter company relations. Prior to the Freescale/Motorola position he worked he worked with the Rober-Bosch GmbH in the development of Smart Power devices.
Daniel Baumeister, Development Engineer, Continental Teves AG & Co. OHG
Development Engineer Integrated Circuits Development within Business Unit EBS (Electronic Brake Systems), Head of Safety IC Basic Development Group responsible for Virtual Prototyping of custom ICs (digital and mixed-signal), Microcontroller safety concepts and MCU architectures.