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New Oscilloscope Capabilities for Upper-level EE Labs Webcast

Original Air Date: May 24, 2011 | Duration: 60 min Webinar
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Overview:
Today's Electrical Engineering teaching labs consist of a variety of test equipment that students use to help bring the theoretical classroom world of engineering into the practical world. The portfolio of test equipment used in university EE teaching labs typically includes multimeters, power supplies, function/arbitrary waveform generators, and oscilloscopes. Upper-level specialty labs often include additional special-purpose test equipment. But the core/central instrument that students use to test and verify electrical experiments in all EE labs is usually the oscilloscope.

When it comes to selecting oscilloscopes for basic entry-level teaching labs, price is often the primary consideration. But when it comes to selecting oscilloscopes for upper-level digital design labs, such as lab courses focused on FPGA design, microprocessor/microcontroller-based designs, as well as labs for senior design projects, more advanced oscilloscope capabilities should also be considered. It is important that students learn that testing higher-speed digital designs requires more than just verifying the presence of 1's and 0's.

Many of today's newer benchtop scopes have measurement capabilities that can help students test and debug the analog parametric characteristics of higher-speed digital designs. Using these more advanced measurement capabilities can help students understand that even in the world of digital design; dynamic analog characteristics can't be ignored.

This webcast will show a variety of newer oscilloscope capabilities/tools that students can use to test the analog characteristics of digital designs. Oscilloscope features/capabilities shown during this webcast include post-acquisition Search & Navigation, pass/fail mask testing, fast waveform update rates to capture infrequent signal anomalies, serial bus triggering and decoding, as well as advanced parametric triggering such as device setup & hold time violation triggering, runt/pulse amplitude violation triggering, and edge transition time violation triggering.

Who should view this webcast:
  • University EE/Physics Professors
  • Teaching Assistants
  • Lab Managers
Presenter: 
Johnnie Hancock, Product Manager, Digital Test Division, Agilent Technologies
Johnnie Hancock is a Product Manager at Agilent Technologies Digital Test Division. He began his career with Hewlett-Packard in 1979 as an embedded hardware designer, and holds a patent for digital oscilloscope amplifier calibration. Johnnie is currently responsible for worldwide application support activities that promote Agilent's digitizing oscilloscopes and he regularly speaks at technical conferences worldwide. Johnnie graduated from the University of South Florida with a degree in electrical engineering. In his spare time, he enjoys spending time with his four grandchildren and restoring his century-old Victorian home located in Colorado Springs. 

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