Optimizing PXI Modular Functional Test System Throughput Webcast
Reducing overall test time in high volume electronic manufacturing sites is critical to meeting manufacturing capacity and cost targets. Optimizing throughput, while not sacrificing test coverage or production yield, is essential to retaining a competitive edge.
Best-in-class manufacturers use statistical methods during test system development to achieve high throughput without compromising test coverage or test yields. During test system development, statistically based Gauge Reliability and Repeatability studies are used to verify the stability of the test methods and test system. After establishing a reliable and repeatable test, methods to optimize throughput can be explored. The statistical methods can be used again to verify test throughput optimization will not impact test yields.
This Webcast will explore these statistical methods used during electronic functional test development and deployment to help the test engineer achieve accurate, reliable results.
Who should view this webcast:
- Test engineers responsible for automated test
- Aerospace and Defense
- Electronic test
- Communications & Semi-conductor testing
Al Lesko, Application Engineer, Agilent Technologies
Al joined Agilent Technologies (Hewlett-Packard) in 1980 working as an R&D engineer on signal source and measurement instrumentation projects as well as development on the popular HP-3070 in-circuit tester test system. In 1989, Al joined the Ford Motor Company and worked on high volume Anti-lock brake electronic control units, where test throughput and test integrity was paramount. Upon returning to Agilent Technologies (Hewlett-Packard) in 1993, Al worked on a variety of test system applications, and was the key hardware system architect on the Agilent TS-5400 Series II automotive functional test system. For the past 4 years Al has been an application engineer with Agilent Technologies Modular Products Organization and Systems Products Divisions.