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Parametric Test Basic Training Part 2

Original Air Date: Jan 19, 2011 | Duration: 60 min. Webinar
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Overview:
This Webcast will extend and expand upon the topics covered in our September 15th webcast. This session will cover more advanced topics such as time-dependent and high-speed measurements. On-wafer capacitance measurement will also be explained, as this is one area where many users have great difficulty. Although this Webcast is designed for users with no previous parametric test background, experienced users may also find the material a useful review. If you did not attend the September 15th webcast, then it is recommended to listen to the recorded version before attending this webcast.

Who should view this webcast:
The webcast is of interest to engineers working in semiconductor process development, reliability, failure analysis and device design. Educators and researchers involved with semiconductor design, nanotechnology and solar cell development would also find the webcast useful and informative.

Giveaway:
Registrants who completely fill out the feedback form by April 19, 2011 will be eligible to win one of two $75 Amazon.com gift certificates. Drawing only open to residents of the 50 United States and Canada (except Quebec). Official rules.

Presenter:
Alan Wadsworth, Market Development Manager, Agilent Technologies
Alan Wadsworth is the North and South American Market Development Manager for Agilent's semiconductor test division. Alan holds bachelors and masters degrees in electrical engineering from the Massachusetts Institute of Technology and an MBA from Santa Clara University. Alan has over 25 years of experience in the semiconductor industry in both design and test.

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