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Design for Test Guidelines for JTAG Testing

Authored on: Aug 18, 2017

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In today's fast paced environment with short time-to-market requirements, it has become increasingly important to design products that allow for early fault and defect detection. The abilty to discover defects early in a product life cycle is known to cost less money, enhance quality, and reduce time to market overall. Therefore, a good Design-For-Test (DFT) strategy is needed for the design, prototype and production phases of a product. This document covers DFT techniques for printed circuit board (PCB) designs utilizing boundary-scan tools in particular.


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