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From Design to Test: Developing High-Reliability MTP NVM

Authored on: Dec 1, 2012 by Martin Niset, Craig Zajac

Technical Paper

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In developing high-quality and reliable MTP NVM, NVM IP providers must account for design and architectural considerations as well as comprehensive silicon testing. To help system-on-chip (SoC) designers select the highest reliability NVM IP, this white paper will review the key considerations involved in the entire process from design to test, including: key reliability specifications; designing-in reliability; and demonstrating reliability through characterization, qualification, and reliability testing.
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