datasheets.com EBN.com EDN.com EETimes.com Embedded.com PlanetAnalog.com TechOnline.com  
Events
UBM Tech
UBM Tech
Welcome Guest Log In | Register

TLV320DAC3100 Test for Detection of Open Loads

Authored on: Jun 1, 2012 by Wen-Shin Wang

Technical Paper / Application Note

0 0
More InfoLess Info
An open load detection test can be implemented using headset-detection test of the TLV320DAC3100. This application note provides a summary of the headset-detection test with the TLV320DAC3100 EVM and how to use the headset-detection test to detect an open load.
View
 
0 comments
write a comment

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page