datasheets.com EBN.com EDN.com EETimes.com Embedded.com PlanetAnalog.com TechOnline.com  
Events
UBM Tech
UBM Tech
Welcome Guest Log In | Register

Leakage Optimized Decap Addition Methodology

Authored on: Aug 10, 2012 by Piyush Mishra et al

Technical Paper

0 0
More InfoLess Info
The proposed methodology optimizes leakage by placing TOD in 'Always-ON' islands and maximizes decoupling capacitance by placing SOD in 'Power Gated' islands in power domain based low power designs.
View
 
0 comments
write a comment

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page

×

Please Login

You will be redirected to the login page