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Improving Low Current Measurements on Nanoelectronic and Molecular Electronic Devices White Paper

Authored on: Jul 26, 2012

Technical Paper

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I-V characterization of nanoelectronic devices requires current measurements in the nanoamp to femtoamp range. To complicate matters, these measurements are quite often made at cryogenic temperatures. Therefore, highly sensitive instruments are required, and appropriate measurement and connection techniques must be employed to avoid errors.
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