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Creating Multi-SMU Systems with High Power System SourceMeter Instruments

Authored on: Apr 17, 2012

Technical Paper / Application Note

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This paper outlines the process of configuring test systems for DC characterization of power semiconductor devices using high voltage and high current source measurement units (SMUs). The steps required include selecting equipment to meet test demands, selecting cabling and fixturing to connect the instruments to the device under test (DUT), verifying system safety and instrument protection, optimizing the instrument setup to ensure measurement integrity, and controlling the instrumentation hardware.
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